Home
Call For Abstracts
Critical Dates
Program
- About
- Venue
- Schedule
- Tutorials
Contact Us
Announcements
- Messages from the Chairs
- News
Exhibitors
Sponsors and Donors
Directions and Lodging
Archive
Register

Messages from the Chairs

Message from the Chair

Chris Brown and Brendan Powers

The International Conference on Surface Metrology 2010 will be the second time that researchers working in a wide variety of fields gather to discuss their common interests in surface metrology.

The first IC on Surface Metrology in October 2009 was a great success with over 40 technical presentations from 8 countries and over 80 attendees. The presentations explored a wide range of application of surface metrology. The 3rd IC on Surface Metrology is planned for October of 2012.

Exposure to the measurement and analysis methods from different fields with their diverse applications can provide new ideas for new approaches in our own. It can also help us to establish better the fundamentals of surface metrology and differentiate them from the specifics of a certain application.

We hope the International Conference on Surface Metrology 2010 will be the second of many. We look forward to seeing many of you in October.

Christopher A. Brown
http://www.me.wpi.edu/People/Brown
Professor of Mechanical Engineering, Fellow ASME
Director, Surface Metrology Lab
Worcester Polytechnic Institute
Worcester, MA

20 February 2010

Maintained by surfacewebmaster@wpi.edu
Last modified: February 20, 2010