CENTER FOR

SURFACE METROLOGY

IN THE AMERICAS

 

VISION

  • Refine measurement techniques
  • Develop new analysis and characterization methods, including algorithms and experimental software
  • Contribute to national and international standards
  • Discover new functional correlations
  • Present and publish work in scientific conferences and journals
  • Provide education on surface metrology theory and practice

MISSION

Advance surface metrology in academia and industry by discovering and disseminating new knowledge